Characterization of one-dimensional quantum channels in InAs/AlSb

Characterization of Piezoelectric Materials for Transducers

Characterization of silicon thin overlayers on rutile \ce{TiO2} (110)-(1x1)

Characterization of the material response in the granular ratcheting

Characterization of the Microstructure of Zirconolite-Based Glass-Ceramics

Characterization of the Noise in Secondary Ion Mass Spectrometry Depth Profiles

Characterization of Thermal Interface Materials to Support Thermal Simulation

Characterization of welding defects by fractal analysis of ultrasonic signals

Characterization of ZnO:Si Nanocomposite Films Grown by Thermal Evaporation

Characterizations of strain and defect free GaN nanorods on Si(111) substrates

Characterizing Quantum-Dot Blinking Using Noise Power Spectra

Characterizing the Hexagonality of Anodic Aluminium Oxide Nanoporous Arrays

Characterizing Voltage Contrast in Photoelectron Emission Microscopy

Charge and Magnetization Inhomogeneities in Diluted Magnetic Semiconductors

Charge and spin Hall effect in graphene with magnetic impurities

Charge Carrier Concentration and Temperature Dependent Recombination in Polymer Fullerene Solar Cells

Charge carrier density collapse in La_0.67Ca_0.33MnO_3 and La_0.67Sr_0.33MnO_3 epitaxial thin films

Charge Carrier Dissociation and Recombination in Polymer Solar Cells

Charge Carrier Extraction by Linearly Increasing Voltage:Analytic framework and ambipolar transients

Charge carrier induced barrier height reduction at organic heterojunctions