Characterization and optimization of MIT Lincoln Laboratories CCID20 CCDs

Characterization and Prediction of the SPI Background

Characterization in the laboratory of VISIR, the mid-infrared imager and spectrometer for the VLT

Characterization of 128x192 Si:Ga focal plane arrays: study of nonuniformity, stability of its correction, and application for the CRYSTAL camera

Characterization of 2.5 microns HgCdTe detectors for low-background applications

Characterization of an x-ray framing camera utilizing a charge coupled device or film as recording media

Characterization of Asteroids 2867 Steins and 21 Lutetia, Targets of the Rosetta Mission

Characterization of atmospheric turbulence using wavefront slope measurements

Characterization of avalanche photodiode arrays for temporally resolved photon counting

Characterization of detectors and calibration of the ISOPHOT experiment

Characterization of DRS Technologies' 256x256 mid-IR arrays for VISIR

Characterization of electrodeposited Zn1-xHgxSe thin films

Characterization of Exoplanet Orbits Based on a Visual Observation History

Characterization of flow in the HET enclosure following ventilation and application of low-emissive coatings

Characterization of gas chromatography/negative ion chemical ionization mass spectrometry for ambient measurement of PAN: Potential interferences and long-term sensitivity drift

Characterization of Hertzian rolling microslip in precision revolute joints for deployable space structures

Characterization of infrared filters for the wide-field camera 3 of Hubble Space Telescope

Characterization of IR focal plane test stations

Characterization of MODIS VIS/NIR spectral band detector-to-detector differences

Characterization of post-correction uniformity on infrared focal plane arrays