X-ray CCD calibration for the AXAF CCD Imaging Spectrometer

Details X-ray CCD calibration for the AXAF CCD Imaging Spectrometer X-ray CCD calibration for the AXAF CCD Imaging Spectrometer

Nov 1998

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1998spie.3444..210b&link_type=abstract

Proc. SPIE Vol. 3444, p. 210-224, X-Ray Optics, Instruments, and Missions, Richard B. Hoover; Arthur B. Walker; Eds.

Physics

Optics

52

Scientific paper

Acquisition of ground calibration data from the AXAF CCD Imaging Spectrometer, one of two focal plane instruments on NASA's Advanced X-ray Astrophysics Facility, was completed in 1997. Here we summarize results of the detector level calibration effort. Our calibration program has included measurements of CCD response to undispersed synchrotron radiation, measurements of x-ray absorption fine structure, and of sub-pixel structure in the detector. Errors in the energy scale are at the level of a few tenths of one percent, and detection efficiency errors are no large than a few percent. We have also obtained new insights into the mechanisms by which the CCD gate structure and channel stops influence the CCD spectral redistribution function.

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