Single-Electron Measurements with a Micromechanical Resonator

Details Single-Electron Measurements with a Micromechanical Resonator Single-Electron Measurements with a Micromechanical Resonator

2001-10-16

arxiv.org/abs/cond-mat/0110302v1

Phys. Rev. A 64, 042318 (2001)

Physics

Condensed Matter

13 pages, 4 figures, RevTeX4

Scientific paper

10.1103/PhysRevA.64.042318

A mechanical electroscope based on a change in the resonant frequency of a cantilever one micron in size in the presence of charge has recently been fabricated. We derive the decoherence rate of a charge superposition during measurement with such a device using a master equation theory adapted from quantum optics. We also investigate the information produced by such a measurement, using a quantum trajectory approach. Such instruments could be used in mesoscopic electronic systems, and future solid-state quantum computers, so it is useful to know how they behave when used to measure quantum superpositions of charge.

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