Pushing the detection limit of Magnetic Circular Dichroism to 2 nm

Details Pushing the detection limit of Magnetic Circular Dichroism to 2 nm Pushing the detection limit of Magnetic Circular Dichroism to 2 nm

2008-03-17

arxiv.org/abs/0803.2415v1

Physics

Condensed Matter

Materials Science

11 pages, 3 figures, submitted to Ultramicroscopy

Scientific paper

Magnetic Circular Dichroism (MCD) is a standard technique for the study of magnetic properties of materials in synchrotron beamlines. We present here a new scattering geometry in the Transmission Electron Microscope through which MCD can be observed with unprecedented spatial resolution. A convergent electron beam is used to scan a multilayer Fe/Au sample and record energy loss spectra. Differences in the spectra induced by the magnetic moments of the Fe atoms can be resolved with a resolution of 2 nm. This is a breakthrough achievement when compared both to the previous EMCD resolution (200 nm) or the best XMCD experiments (approx. 20 nm), with an improvement of two and one order of magnitude, respectively.

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