Near-edge x-ray absorption fine structure investigation of graphene

Details Near-edge x-ray absorption fine structure investigation of graphene Near-edge x-ray absorption fine structure investigation of graphene

2008-05-15

arxiv.org/abs/0805.2269v1

Physics

Condensed Matter

Materials Science

5 pages, 4 figures

Scientific paper

10.1103/PhysRevLett.101.066806

We report the near-edge x-ray absorption fine structure (NEXAFS) spectrum of a single layer of graphite (graphene) obtained by micromechanical cleavage of Highly Ordered Pyrolytic Graphite (HOPG) on a SiO2 substrate. We utilized a PhotoEmission Electron Microscope (PEEM) to separately study single- double- and few-layers graphene (FLG) samples. In single-layer graphene we observe a splitting of the pi* resonance and a clear signature of the predicted interlayer state. The NEXAFS data illustrate the rapid evolution of the electronic structure with the increased number of layers.

Affiliated with

Also associated with

No associations

Rating

Near-edge x-ray absorption fine structure investigation of graphene does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Near-edge x-ray absorption fine structure investigation of graphene, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Near-edge x-ray absorption fine structure investigation of graphene will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-509564