Mesoscopic electronic heterogeneities in the transport properties of V2O3 thin films

Details Mesoscopic electronic heterogeneities in the transport properties of V2O3 thin films Mesoscopic electronic heterogeneities in the transport properties of V2O3 thin films

2008-07-28

arxiv.org/abs/0807.4370v2

Physics

Condensed Matter

Materials Science

extended version accepted in Journal of Physics: Condensed Matter. More references and figures. More details are given on the

Scientific paper

10.1088/0953-8984/20/47/472205

The spectacular metal-to-insulator transition of V2O3 can be progressively suppressed in thin film samples. Evidence for phase separation was observed using microbridges as a mesoscopic probe of transport properties where the same film possesses domains that exhibit a metal-to-insulator transition with clear first order features or remain metallic down to low temperatures. A simple model consisting of two parallel resistors can be used to quantify a phase coexistence scenario explaining the measured macroscopic transport properties. The interaction between film and substrate is the most plausible candidate to explain this extended phase coexistence as shown by a correlation between the transport properties and the structural data.

Affiliated with

Also associated with

No associations

Rating

Mesoscopic electronic heterogeneities in the transport properties of V2O3 thin films does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Mesoscopic electronic heterogeneities in the transport properties of V2O3 thin films, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Mesoscopic electronic heterogeneities in the transport properties of V2O3 thin films will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-312734