Material parameter and performance variation in 4 X 4 pixelated CdZnTe detectors

Details Material parameter and performance variation in 4 X 4 pixelated CdZnTe detectors Material parameter and performance variation in 4 X 4 pixelated CdZnTe detectors

Jul 1997

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1997spie.3115...56b&link_type=abstract

Proc. SPIE Vol. 3115, p. 56-61, Hard X-Ray and Gamma-Ray Detector Physics, Optics, and Applications, Richard B. Hoover; F. Patri

Physics

Optics

Scientific paper

Cadmium zinc telluride (CZT) gamma-ray detectors show great potential in medical and nuclear material imaging applications. These imagers rely on pixellated arrays of CZT for their operation. Systematic and random material variation among the pixels can introduce noise into the system and makes data analysis more complicated. Photo induced transient current spectroscopy (PICTS), and low temperature photoluminescence have been employed to analyze 4 by 4 pixellated arrays and to determine material variation among the pixels. Particular pixels that have proven to perform well or poorly have been studied in detail to try and identify the origin of this performance variation. This paper reports preliminary results and comments on future analysis.

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