Physics – Optics
Scientific paper
Jul 1997
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1997spie.3115...62y&link_type=abstract
Proc. SPIE Vol. 3115, p. 62-68, Hard X-Ray and Gamma-Ray Detector Physics, Optics, and Applications, Richard B. Hoover; F. Patri
Physics
Optics
7
Scientific paper
Polarized transmission optical profiles were used to characterize the CdZnTe (CZT) room-temperature radiation detectors. The internal electric field distributions of the CZT detectors under bias were probed by a 952 nm illumination between two crossed Glan-Taylor polarizers. A 16-bit digital charge coupled device (CCD) was employed as an image sensor. The 2-dimensional (2D) images reflecting the internal electrical field intensity changes were obtained utilizing the Pockels electro-optic effect. CZT detectors of crystal sizes of 5 by 5 by 5 mm were investigated under different bias voltages. Uniform and nonuniform internal electric field distributions throughout the detector volumes, under different light illumination conditions, were observed and analyzed. A theoretical model of the semiconductor energy band structure under the bias was established and used to understand the measurement results.
Anderson Richard J.
James Ralph B.
Yao Walter H.
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