Layer dependent band dispersion and correlations using tunable Soft X-ray ARPES

Details Layer dependent band dispersion and correlations using tunable Soft X-ray ARPES Layer dependent band dispersion and correlations using tunable Soft X-ray ARPES

2003-11-24

arxiv.org/abs/cond-mat/0311547v2

Physics

Condensed Matter

Strongly Correlated Electrons

7 pages, 3 figures Revised text and figure

Scientific paper

10.1209/epl/i2004-10052-6

Soft X-ray Angle-Resolved Photoemission Spectroscopy is applied to study in-plane band dispersions of Nickel as a function of probing depth. Photon energies between 190 and 780 eV were used to effectively probe up to 3-7 layers. The results show layer dependent band dispersion of the Delta_2 minority-spin band which crosses the Fermi level in 3 or more layers, in contrast to known top 1-2 layers dispersion obtained using ultra-violet rays. The layer dependence corresponds to an increased value of exchange splitting and suggests reduced correlation effects in the bulk compared to the surface.

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