Imaging Microwave Electric Fields Using a Near-Field Scanning Microwave Microscope

Details Imaging Microwave Electric Fields Using a Near-Field Scanning Microwave Microscope Imaging Microwave Electric Fields Using a Near-Field Scanning Microwave Microscope

1998-11-10

arxiv.org/abs/cond-mat/9811140v1

Appl. Phys. Lett. 74, 156 (1999)

Physics

Condensed Matter

10 pages, 3 eps-figures, accepted by Appl. Phys. Lett

Scientific paper

10.1063/1.123137

By scanning a fine open-ended coaxial probe above an operating microwave device, we image local electric fields generated by the device at microwave frequencies. The probe is sensitive to the electric flux normal to the face of its center conductor, allowing different components of the field to be imaged by orienting the probe appropriately. Using a simple model of the microscope, we are able to interpret the system's output and determine the magnitude of the electric field at the probe tip. We show images of electric field components above a copper microstrip transmission line driven at 8 GHz, with a spatial resolution of approximately 200 $\mu$m.

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