Detection of mechanical resonance of a single-electron transistor by direct current

Details Detection of mechanical resonance of a single-electron transistor by direct current Detection of mechanical resonance of a single-electron transistor by direct current

2010-04-19

arxiv.org/abs/1004.3074v1

Physics

Condensed Matter

Mesoscale and Nanoscale Physics

4 pages, 3 figures

Scientific paper

We have suspended an Al based single-electron transistor whose island can resonate freely between the source and drain leads forming the clamps. In addition to the regular side gate, a bottom gate with a larger capacitance to the SET island is placed underneath to increase the SET coupling to mechanical motion. The device can be considered as a doubly clamped Al beam that can transduce mechanical vibrations into variations of the SET current. Our simulations based on the orthodox model, with the SET parameters estimated from the experiment, reproduce the observed transport characteristics in detail.

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