A Novel Dielectric Anomaly in Cuprates and Nickelates: Signature of an Electronic Glassy State

Details A Novel Dielectric Anomaly in Cuprates and Nickelates: Signature of an Electronic Glassy State A Novel Dielectric Anomaly in Cuprates and Nickelates: Signature of an Electronic Glassy State

2004-04-19

arxiv.org/abs/cond-mat/0404446v1

Phys. Rev. Lett. 94, 017002 (2005)

Physics

Condensed Matter

Strongly Correlated Electrons

5 pages, 4 figures

Scientific paper

10.1103/PhysRevLett.94.017002

The low-frequency dielectric response of hole-doped insulators La_{2}Cu_{1-x}Li_{x}O_{4} and La_{2-x}Sr_{x}NiO_{4} shows a large dielectric constant \epsilon ^{'} at high temperature and a step-like drop by a factor of 100 at a material-dependent low temperature T_{f}. T_{f} increases with frequency and the dielectric response shows universal scaling in a Cole-Cole plot, suggesting that a charge glass state is realized both in the cuprates and in the nickelates.

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