Physics – Condensed Matter – Materials Science
Scientist
Physics
Condensed Matter
Materials Science
Scientist
Computer Network Services Inc., Denville, NJ
Application of Raman Scattering to Study the Strain Distribution in SiGe Layers
Application of Ultraviolet Fluorescence in Wafer Surface Cleaning Analysis
High-sensitivity (25-um pitch) microbolometer FPAs
High-sensitivity 25-micron microbolometer FPAs
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