Physics
Scientist
I. Franko National University of Lviv
Ivan Franko State University
Epitaxial layer CdHgTe stress influence on diffusion impurities during creation of photodetectors
Porous silicon and cadmium-mercury-telluride (CMT)-based heterostructures for IR detectors
Porous silicon photoemission for possible electronic and accessory applications
RF magnetron sputtering SiOx, ZnS, and Al2O3 films for capsulation of nanostructured porous silicon
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