Phonons in Crystals using Inelastic X-Ray Scattering

Details Phonons in Crystals using Inelastic X-Ray Scattering Phonons in Crystals using Inelastic X-Ray Scattering

2009-10-30

arxiv.org/abs/0910.5764v1

Journal of The Spectroscopical Society of Japan, Vol. 58, #5 (2009), pp 205-214

Physics

Condensed Matter

Materials Science

English version of a paper in Japanese

Scientific paper

The use of inelastic x-ray scattering (IXS) to investigate phonons and phonon dispersion in crystals opens the field of phonon spectroscopy, allowing measurements on tiny samples: micrograms of material, or single crystals ~10 to 100 micron diameter are sufficient. Here we review the technique as it is practiced at BL35XU of SPring-8, in Hyogo prefecture. An introduction is provided that is aimed at potential IXS users, highlighting the unique and advantageous aspects of the technique. Present work, including several example experiments, and future directions are discussed.

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