Optimal static and dynamic recycling of defective binary devices

Details Optimal static and dynamic recycling of defective binary devices Optimal static and dynamic recycling of defective binary devices

2004-07-26

arxiv.org/abs/cond-mat/0407664v1

Physics

Condensed Matter

Disordered Systems and Neural Networks

14 pages, 15 figures

Scientific paper

10.1088/1742-5468/2004/11/P11003

The binary Defect Combination Problem consists in finding a fully working subset from a given ensemble of imperfect binary components. We determine the typical properties of the model using methods of statistical mechanics, in particular, the region in the parameter space where there is almost surely at least one fully-working subset. Dynamic recycling of a flux of imperfect binary components leads to zero wastage.

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