On the reorientation transition of ultra-thin Ni/Cu(001) films

Details On the reorientation transition of ultra-thin Ni/Cu(001) films On the reorientation transition of ultra-thin Ni/Cu(001) films

1998-12-30

arxiv.org/abs/cond-mat/9812421v1

J. Magn. Magn. Mater. 198-199, 491 (1999)

Physics

Condensed Matter

Statistical Mechanics

7 pages(LaTeX2e) with one figure(eps), accepted for publication in JMMM. See also http://www.thp.Uni-Duisburg.DE/Publikationen

Scientific paper

10.1016/S0304-8853(98)01200-1

The reorientation transition of the magnetization of ferromagnetic films is studied on a microscopic basis within a Heisenberg spin model. Using a modified mean field formulation it is possible to calculate properties of magnetic thin films with non-integer thicknesses. This is especially important for the reorientation transition in Ni/Cu(001), as there the magnetic properties are a sensitive function of the film thickness. Detailed phase diagrams in the thickness-temperature plane are calculated using experimental parameters and are compared with experimental measurements by Baberschke and Farle (J. Appl. Phys. 81, 5038 (1997)).

Affiliated with

Also associated with

No associations

Rating

On the reorientation transition of ultra-thin Ni/Cu(001) films does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with On the reorientation transition of ultra-thin Ni/Cu(001) films, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and On the reorientation transition of ultra-thin Ni/Cu(001) films will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-725905