High real-space resolution measurement of the local structure of Ga_1-xIn_xAs using x-ray diffraction

Details High real-space resolution measurement of the local structure of Ga_1-xIn_xAs using x-ray diffraction High real-space resolution measurement of the local structure of Ga_1-xIn_xAs using x-ray diffraction

1999-06-07

arxiv.org/abs/cond-mat/9906099v1

Phys. Rev. Lett. 83, 4089-4092 (1999)

Physics

Condensed Matter

Materials Science

4 pages, 5 figures

Scientific paper

10.1103/PhysRevLett.83.4089

High real-space resolution atomic pair distribution functions (PDF)s from the alloy series Ga_1-xIn_xAs have been obtained using high-energy x-ray diffraction. The first peak in the PDF is resolved as a doublet due to the presence of two nearest neighbor bond lengths, Ga-As and In-As, as previously observed using XAFS. The widths of nearest, and higher, neighbor pairs are analyzed by separating the strain broadening from the thermal motion. The strain broadening is five times larger for distant atomic neighbors as compared to nearest neighbors. The results are in agreement with model calculations.

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