Finite-temperature resistive transition in the two-dimensional XY gauge glass model

Details Finite-temperature resistive transition in the two-dimensional XY gauge glass model Finite-temperature resistive transition in the two-dimensional XY gauge glass model

2000-04-05

arxiv.org/abs/cond-mat/0004069v1

Phys. Rev. B 62, 644 (2000)

Physics

Condensed Matter

Superconductivity

5 pages in two columns, 4 eps figures included, to appear in PRB

Scientific paper

10.1103/PhysRevB.62.644

We investigate numerically the resistive transition in the two-dimensional XY gauge glass model. The resistively-shunted junction dynamics subject to the fluctuating twist boundary condition is used and the linear resistances in the absence of an external current at various system sizes are computed. Through the use of the standard finite-size scaling method, the finite temperature resistive transition is found at $k_BT_c = 0.22(2)$ (in units of the Josephson coupling strength) with dynamic critical exponent $z = 2.0(1)$ and the static exponent $\nu = 1.2(2)$, in contrast to widely believed expectation of the zero-temperature transition. Comparisons with existing experiments and simulations are also made.

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