Electronic Hong-Ou-Mandel interferometer for multi-mode entanglement detection

Details Electronic Hong-Ou-Mandel interferometer for multi-mode entanglement detection Electronic Hong-Ou-Mandel interferometer for multi-mode entanglement detection

2006-06-15

arxiv.org/abs/cond-mat/0606413v3

Phys. Rev. B 74, 115315 (2006)

Physics

Condensed Matter

Mesoscale and Nanoscale Physics

6 pages. Revised version. Ref. added

Scientific paper

10.1103/PhysRevB.74.115315

We show that multi-mode entanglement of electrons in a mesoscopic conductor can be detected by a measurement of the zero-frequency current correlations in an electronic Hong-Ou-Mandel interferometer. By this mean, one can further establish a lower bound to the entanglement of formation of two-electron input states. Our results extend the work of Burkard and Loss [Phys. Rev. Lett. 91, 087903 (2003)] to many channels and provide a way to test the existence of entangled states involving both orbital and spin degrees of freedom.

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