X-ray scattering study of two length scales in the critical fluctuations of CuGeO3

Details X-ray scattering study of two length scales in the critical fluctuations of CuGeO3 X-ray scattering study of two length scales in the critical fluctuations of CuGeO3

2000-04-20

arxiv.org/abs/cond-mat/0004363v1

Physics

Condensed Matter

Strongly Correlated Electrons

5 pages, 4 figures, submitted to PRB

Scientific paper

10.1103/PhysRevB.63.052502

The critical fluctuations of CuGeO$_3$ have been measured by synchrotron x-ray scattering, and two length scales are clearly observed. The ratio between the two length scales is found to be significantly different along the $a$ axis, with the $a$ axis along the surface normal direction. We believe that such a directional preference is a clear sign that surface random strains, especially those caused by dislocations, are the origin of the long length scale fluctuations.

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