Steady-state cracking in brittle substrates beneath adherent films: revisited

Details Steady-state cracking in brittle substrates beneath adherent films: revisited Steady-state cracking in brittle substrates beneath adherent films: revisited

2011-11-26

arxiv.org/abs/1111.6152v2

Physics

Condensed Matter

Materials Science

43 pages, 13 figures, 10 tables

Scientific paper

This is a technical note aiming at the re-examination of the phenomenon of the steady-state cracking in the two-layer system. The method of Suo and Hutchinson, as introduced in their 1989 paper, is followed. Our solution is compared with the one appearing in that paper for the substrate-to-film thickness ratio $\lambda_0=10$. We obtain results at three $\lambda_0<10$ values. Combined with the results for $\lambda_0=10$, the new sets of values cover thickness ratios between 1 and 10, sufficient for determining crack initiation and propagation in almost every relevant problem. We present our results in tables (and figures), thus facilitating their implementation and use.

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