Polarization anisotropy in the optical properties of silicon ellipsoids

Details Polarization anisotropy in the optical properties of silicon ellipsoids Polarization anisotropy in the optical properties of silicon ellipsoids

2007-07-10

arxiv.org/abs/0707.1499v1

Surface Science 601, 2702 (2007)

Physics

Condensed Matter

Materials Science

5 pages, 4 figures, International Conference on NANO-Structures Self-Assembling

Scientific paper

10.1016/j.susc.2006.12.020

A new real space quantum mechanical approach with local field effects included is applied to the calculation of the optical properties of silicon nanocrystals. Silicon ellipsoids are studied and the role of surface polarization is discussed in details. In particular, surface polarization is shown to be responsible for a strong optical anisotropy in silicon ellipsoids, much more pronounced with respect to the case in which only quantum confinement effects are considered. The static dielectric constant and the absorption spectra are calculated, showing that the perpendicular and parallel components have a very different dependence on the ellipsoid aspect ratio. Then, a comparison with the classical dielectric model is performed, showing that the model only works for large and regular structures, but it fails for thin elongated ellipsoids.

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