Rietveld refinement of ZrSiO4: application of a phenomenological model of anisotropic peak width

Details Rietveld refinement of ZrSiO4: application of a phenomenological model of anisotropic peak width Rietveld refinement of ZrSiO4: application of a phenomenological model of anisotropic peak width

2007-02-10

arxiv.org/abs/cond-mat/0702262v1

Physics

Condensed Matter

Materials Science

Presented at European Powder Diffraction Conference (EPDIC 10), Geneva

Scientific paper

The anisotropic broadening of ZrSiO4 sample is modelled using the Stephens's
phenomenological model for anisotropic line broadening and the three
dimensional strain distribution in the sample is plotted. The micro-structural
parameters like domain size and dislocation density are estimated using the
variance method.

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