Structure determination of the indium-induced Si(111)-(4x1) reconstruction by surface x-ray diffraction

Details Structure determination of the indium-induced Si(111)-(4x1) reconstruction by surface x-ray diffraction Structure determination of the indium-induced Si(111)-(4x1) reconstruction by surface x-ray diffraction

1999-09-20

arxiv.org/abs/cond-mat/9909286v1

Phys. Rev. B 59, 12228 (1999)

Physics

Condensed Matter

Materials Science

RevTeX, 5 pages including 3 figures

Scientific paper

10.1103/PhysRevB.59.12228

A detailed structural model for the indium-induced Si(111)-(4x1) surface reconstruction has been determined by analyzing an extensive set of x-ray-diffraction data recorded with monochromatic ($\hbar\omega$ = 9.1 keV) synchrotron radiation. The reconstruction is quasi-one-dimensional. The main features in the structure are chains of silicon atoms alternating with zigzag chains of indium atoms on top of an essentially unperturbed silicon lattice. The indium coverage corresponds to one monolayer. The structural model consistently explains all previously published experimental data.

Affiliated with

Also associated with

No associations

Rating

Structure determination of the indium-induced Si(111)-(4x1) reconstruction by surface x-ray diffraction does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Structure determination of the indium-induced Si(111)-(4x1) reconstruction by surface x-ray diffraction, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Structure determination of the indium-induced Si(111)-(4x1) reconstruction by surface x-ray diffraction will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-429399