Conductance Distributions in Random Resistor Networks: Self Averaging and Disorder Lengths

Details Conductance Distributions in Random Resistor Networks: Self Averaging and Disorder Lengths Conductance Distributions in Random Resistor Networks: Self Averaging and Disorder Lengths

1994-05-04

arxiv.org/abs/cond-mat/9405010v1

Physics

Condensed Matter

16 pages plain TeX file, 6 figures available upon request.IBC-1603-012

Scientific paper

10.1007/BF02186283

The self averaging properties of conductance $g$ are explored in random resistor networks with a broad distribution of bond strengths $P(g)\simg^{\mu-1}$. Distributions of equivalent conductances are estimated numerically on hierarchical lattices as a function of size $L$ and distribution tail parameter $\mu$. For networks above the percolation threshold, convergence to a Gaussian basin is always the case, except in the limit $\mu$ --> 0. A {\it disorder length} $\xi_D$ is identified beyond which the system is effectively homogeneous. This length diverges as $\xi_D \sim |\mu|^{-\nu}$ ($\nu$ is the regular percolation correlation length exponent) as $\mu$-->0. This suggest that exactly the same critical behavior can be induced by geometrical disorder and bu strong bond disorder with the bond occupation probability $p$<-->$\mu$. Only lattices at the percolation threshold have renormalized probability distribution in a {\it Levy-like} basin. At the threshold the disorder length diverges at a vritical tail strength $\mu_c$ as $|\mu-\mu_c|^{-z}$, with $z=3.2\pm 0.1$, a new exponent. Critical path analysis is used in a generalized form to give form to give the macroscopic conductance for lattice above $p_c$.

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