Physics – Condensed Matter – Mesoscale and Nanoscale Physics
Scientific paper
2011-02-14
Appl. Phys. Lett. 98, 172510 (2011)
Physics
Condensed Matter
Mesoscale and Nanoscale Physics
Scientific paper
10.1063/1.3583449
We have fabricated superconducting microwave resonators in a lumped element geometry using single crystal silicon dielectric parallel plate capacitors with C >2 pF. Aluminum devices with resonant frequencies between 4.0 and 6.5 GHz exhibited an average internal quality factor Q_i of 2 x 10^5 in the single photon excitation regime at T = 20 mK. Attributing all the observed loss to the capacitive element, our measurements correspond to a loss tangent of intrinsic silicon of 5 x 10^-6. This level of loss is an order of magnitude lower than is currently observed in structures incorporating amorphous dielectric materials, thus making single crystal silicon capacitors an attractive, robust route for realizing long-lived quantum circuits.
Murch Kater W.
Siddiqi Irfan
Slichter D. H.
Vijay R.
Weber Sebastian
No associations
LandOfFree
Single crystal silicon capacitors with low microwave loss in the single photon regime does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.
If you have personal experience with Single crystal silicon capacitors with low microwave loss in the single photon regime, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Single crystal silicon capacitors with low microwave loss in the single photon regime will most certainly appreciate the feedback.
Profile ID: LFWR-SCP-O-377651