Ferromagnetic tunneling junctions at low voltages: elastic versus inelastic scattering at $T=0 K$

Physics – Condensed Matter – Mesoscale and Nanoscale Physics

Scientific paper

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

13 pages, 4 figures (in postscript format). PACS numbers: 72.25.-b, 73.23.-b, 72.10.Di

Scientific paper

10.1063/1.1703825

In this paper we analyze different contributions to the magnetoresistance of magnetic tunneling junctions at low voltages. A substantial fraction of the resistance drop with voltage can be ascribed to variations of the density of states and the barrier transmission with the bias. However, we found that the anomaly observed at zero bias and the magnetoresistance behavior at very small voltages, point to the contribution of inelastic magnon-assisted tunneling. The latter is described by a transfer parameter $T^{J}$, which is one or two orders of magnitude smaller than $T^{d}$, the direct transmission for elastic currents. Our theory is in excellent agreement with experimental data, yielding estimated values of $T^{J}$ which are of the order of $T^{d}$ / $T^{J}$ ~ 40.

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for scientists and scientific papers. Rate them and share your experience with other people.

Rating

Ferromagnetic tunneling junctions at low voltages: elastic versus inelastic scattering at $T=0 K$ does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Ferromagnetic tunneling junctions at low voltages: elastic versus inelastic scattering at $T=0 K$, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Ferromagnetic tunneling junctions at low voltages: elastic versus inelastic scattering at $T=0 K$ will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFWR-SCP-O-322984

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.