Electronic-Transport Properties of Al-Cu-Fe Thin Films

Details Electronic-Transport Properties of Al-Cu-Fe Thin Films Electronic-Transport Properties of Al-Cu-Fe Thin Films

1999-11-23

arxiv.org/abs/cond-mat/9911371v1

Proceedings of the 6th Int. Conf. on quasicrystals;eds.: S. Takeuchi, T. Fujiwara; World Scientific (1998), p. 643

Physics

Condensed Matter

Materials Science

4 pages, 4 figures, Conf. Proc. ICQ6 (Tokyo, 1997)

Scientific paper

Amorphous samples of Al-Cu-Fe were crystallized to the icosahedral phase under the control of electrical conductivity and thermopower at a rather small temperature of T=720 K. A comparison between different annealing states of the amorphous and the resulting quasicrystalline phase done on the same sample shows aston-ishing parallels in conductivity and large differences in thermopower.

Affiliated with

Also associated with

No associations

Rating

Electronic-Transport Properties of Al-Cu-Fe Thin Films does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Electronic-Transport Properties of Al-Cu-Fe Thin Films, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electronic-Transport Properties of Al-Cu-Fe Thin Films will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-304372