Direct Imaging of Submicron Scale Defect-induced Birefringence in SrTiO$_{3}$ Bicrystals

Details Direct Imaging of Submicron Scale Defect-induced Birefringence in SrTiO$_{3}$ Bicrystals Direct Imaging of Submicron Scale Defect-induced Birefringence in SrTiO$_{3}$ Bicrystals

1998-02-04

arxiv.org/abs/cond-mat/9802058v1

Physics

Condensed Matter

Materials Science

LATEX, 13 pages, 3 jpeg and 1 postscript figures

Scientific paper

10.1063/1.368015

Using a near-field scanning optical microscope capable of quantitative polarimetry, we map the anisotropic strain fields associated with individual submicron defects near the fusion boundaries of SrTiO$_{3}$ bicrystals. Many defects exhibit unexpected spiral-shape strain patterns, whose handedness is believed to be linked to the bicrystal synthesis process. Direct observation of these defect-induced strain fields helps explain previously observed non-uniformity in the characteristics of high temperature superconductor grain boundary junctions fabricated on SrTiO$_{3}$ bicrystals.

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