Roughening, deroughening, and nonuniversal scaling of the interface width in electrophoretic deposition of polymer chains

Details Roughening, deroughening, and nonuniversal scaling of the interface width in electrophoretic deposition of polymer chains Roughening, deroughening, and nonuniversal scaling of the interface width in electrophoretic deposition of polymer chains

2006-07-03

arxiv.org/abs/cond-mat/0607062v1

Phys. Rev. E 62, 914--917 (2000)

Physics

Condensed Matter

Soft Condensed Matter

5 pages, 5 figures, RevTex

Scientific paper

10.1103/PhysRevE.62.914

Growth and roughness of the interface of deposited polymer chains driven by a field onto an impenetrable adsorbing surface are studied by computer simulations in (2+1) dimensions. The evolution of the interface width W shows a crossover from short-time growth described by the exponent beta1 to a long-time growth with exponent beta2 (>beta1). The saturated width increases, i.e., the interface roughens, with the molecular weight Lc, but the roughness exponent alpha (from Ws~L^alpha) becomes negative in contrast to models for particle deposition; alpha depends on the chain length--a nonuniversal scaling with the substrate length L. Roughening and deroughening occur as the field E and the temperature T compete such that Ws=(A+BT)E^-1/2.

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