Two-dimensional Dilute Ising Models: Defect Lines and the Universality of the Critical Exponent ν

Details Two-dimensional Dilute Ising Models: Defect Lines and the Universality of the Critical Exponent ν Two-dimensional Dilute Ising Models: Defect Lines and the Universality of the Critical Exponent ν

1999-01-05

arxiv.org/abs/cond-mat/9901026v1

J. Stat. Phys., 95 (1999) 763

Physics

Condensed Matter

Statistical Mechanics

4 pages in RevTeX, 4 eps figures included, submitted to J. Stat. Phys

Scientific paper

We consider two-dimensional Ising models with randomly distributed ferromagnetic bonds and study the local critical behavior at defect lines by extensive Monte Carlo simulations. Both for ladder and chain type defects, non-universal critical behavior is observed: the critical exponent of the defect magnetization is found to be a continuous function of the strength of the defect coupling. Analyzing corresponding stability conditions, we obtain new evidence that the critical exponent $\nu$ of the bulk correlation length of the random Ising model does not depend on dilution, i.e. $\nu=1$.

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