Influence of the inhomogeneous field at the tip on quantitative piezoresponse force microscopy

Details Influence of the inhomogeneous field at the tip on quantitative piezoresponse force microscopy Influence of the inhomogeneous field at the tip on quantitative piezoresponse force microscopy

2006-07-12

arxiv.org/abs/cond-mat/0607313v1

Appl. Phys. A 86, 353-355 (2007)

Physics

Condensed Matter

Materials Science

Scientific paper

Ferroelectric domain imaging with piezoresponse force microscopy (PFM) relies on the converse piezoelectric effect: a voltage applied to the sample leads to mechanical deformations. In case of PFM one electrode is realized by the tip, therefore generating a strongly inhomogeneous electric field distribution inside the sample which reaches values up to $10^8 $V/m directly underneath the apex of the tip. Although often assumed, this high electric field does not lead to an enhancement of the piezoelectric deformation of the sample. On the contrary, internal clamping of the material reduces the observed deformation compared to the theoretically expected value which depends only on the voltage thus being independent of the exact field distribution.

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