Physics – Condensed Matter – Statistical Mechanics
Scientific paper
2007-10-09
Phys. Rev. Lett. 100, 077204 (2008)
Physics
Condensed Matter
Statistical Mechanics
4 pages including 4 figures; generalized the discussion of the defect density scaling to the case of arbitrary critical expone
Scientific paper
10.1103/PhysRevLett.100.077204
We show that for a d-dimensional model in which a quench with a rate \tau^{-1} takes the system across a d-m dimensional critical surface, the defect density scales as n \sim 1/\tau^{m\nu/(z\nu +1)}, where \nu and z are the correlation length and dynamical critical exponents characterizing the critical surface. We explicitly demonstrate that the Kitaev model provides an example of such a scaling with d=2 and m=\nu=z=1. We also provide the first example of an exact calculation of some multispin correlation functions for a two-dimensional model which can be used to determine the correlation between the defects. We suggest possible experiments to test our theory.
Mondal Shreyoshi
Sen Diptiman
Sengupta Kausik
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