XMCD characterization of rare-earth dopants in Ni$_{81}$Fe$_{19}$(50nm): microscopic basis of engineered damping

Details XMCD characterization of rare-earth dopants in Ni$_{81}$Fe$_{19}$(50nm): microscopic basis of engineered damping XMCD characterization of rare-earth dopants in Ni$_{81}$Fe$_{19}$(50nm): microscopic basis of engineered damping

2004-03-25

arxiv.org/abs/cond-mat/0403627v1

Physics

Condensed Matter

Materials Science

4 pages, 2 figures

Scientific paper

We present direct evidence for the contribution of local orbital moments to the damping of magnetization precession in magnetic thin films. Using x-ray magnetic circular dichroism (XMCD) characterization of rare-earth (RE) M$_{4,5}$ edges in Ni$_{81}$Fe$_{19}$ doped with $<$ 2% Gd and Tb, we show that the enhancement of GHz precessional relaxation is accompanied by a significant orbital moment fraction on the RE site. Tb impurities, which enhance the Landau-Lifshitz(-Gilbert) LL(-G) damping $\lambda(\alpha)$, show a spin to orbital number ratio of 1.5$\pm$0.3; Gd impurities, which have no effect on damping, show a spin to orbital number ratio of zero within experimental error. The results indicate that the dopant-based control of magnetization damping in RE-doped ferromagnets is an atomistic effect, arising from spin-lattice coupling, and thus scalable to nanometer dimensions.

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