X-Ray Scattering at Lanthanide M5 Resonances: Application to Magnetic Depth Profiling

Details X-Ray Scattering at Lanthanide M5 Resonances: Application to Magnetic Depth Profiling X-Ray Scattering at Lanthanide M5 Resonances: Application to Magnetic Depth Profiling

2005-09-28

arxiv.org/abs/cond-mat/0509725v1

Physics

Condensed Matter

Other Condensed Matter

4 pages, 4 figures

Scientific paper

Quantitative analyses of x-ray scattering from thin films of Ho and Dy metal at the M_5 resonances result in values of the optical constants and the magnetic scattering lengths f_m, with f_m as large as 200 r_0. The observation of first- and second-order magnetic satellites allows to separate f_m into circular and linear dichroic contributions. This high magnetic sensitivity, in conjunction with the tunable x-ray probing depth across the resonance can be applied to monitor depth profiles of complex magnetic structures, as e.g. of helical antiferromagnetic domains in a Dy metal film.

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