X-ray Near Field Speckle: Implementation and Critical Analysis

Details X-ray Near Field Speckle: Implementation and Critical Analysis X-ray Near Field Speckle: Implementation and Critical Analysis

2011-02-15

arxiv.org/abs/1102.3115v1

Physics

Condensed Matter

Soft Condensed Matter

53 pages, 16 figures

Scientific paper

We have implemented the newly-introduced, coherence-based technique of x-ray near-field speckle (XNFS) at 8-ID-I at the Advanced Photon Source. In the near field regime of high-brilliance synchrotron x-rays scattered from a sample of interest, it turns out, that, when the scattered radiation and the main beam both impinge upon an x-ray area detector, the measured intensity shows low-contrast speckles, resulting from interference between the incident and scattered beams. We built a micrometer-resolution XNFS detector with a high numerical aperture microscope objective and demonstrate its capability for studying static structures and dynamics at longer length scales than traditional far field x-ray scattering techniques. Specifically, we characterized the structure and dynamics of dilute silica and polystyrene colloidal samples. Our study reveals certain limitations of the XNFS technique, which we discuss.

Affiliated with

Also associated with

No associations

Rating

X-ray Near Field Speckle: Implementation and Critical Analysis does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with X-ray Near Field Speckle: Implementation and Critical Analysis, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and X-ray Near Field Speckle: Implementation and Critical Analysis will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-378648