Voltage dependent conductance and shot noise in quantum microconstriction with single defects

Details Voltage dependent conductance and shot noise in quantum microconstriction with single defects Voltage dependent conductance and shot noise in quantum microconstriction with single defects

2004-08-31

arxiv.org/abs/cond-mat/0408679v1

Phys. Rev. B, V. 70, 075308 (2004)

Physics

Condensed Matter

Mesoscale and Nanoscale Physics

18 pages,5 figures

Scientific paper

10.1103/PhysRevB.70.075308

The influence of the interference of electron waves, which are scattered by
single impurities and by a barrier on nonlinear conductance and shot noise of
metallic microconstriction is studied theoretically. It is shown that the these
characteristics are nonmonotonic functions on the applied bias.

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