Variable - temperature scanning optical and force microscope

Details Variable - temperature scanning optical and force microscope Variable - temperature scanning optical and force microscope

2004-03-06

arxiv.org/abs/cond-mat/0403185v1

Physics

Condensed Matter

Other Condensed Matter

24 pages, 9 figures, submitted to the journal "Review of Scientific Instruments"

Scientific paper

10.1063/1.1784560

The implementation of a scanning microscope capable of working in confocal, atomic force and apertureless near field configurations is presented. The microscope is designed to operate in the temperature range 4 - 300 K, using conventional helium flow cryostats. In AFM mode, the distance between the sample and an etched tungsten tip is controlled by a self - sensing piezoelectric tuning fork. The vertical position of both the AFM head and microscope objective can be accurately controlled using piezoelectric coarse approach motors. The scanning is performed using a compact XYZ stage, while the AFM and optical head are kept fixed, allowing scanning probe and optical measurements to be acquired simultaneously and in concert. The free optical axis of the microscope enables both reflection and transmission experiments to be performed.

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