UTA versus line emission for EUVL: Studies on xenon emission at the NIST EBIT

Details UTA versus line emission for EUVL: Studies on xenon emission at the NIST EBIT UTA versus line emission for EUVL: Studies on xenon emission at the NIST EBIT

2005-07-06

arxiv.org/abs/physics/0507046v1

Journal of Physics D 37 (2004) 3225-3232

Physics

Atomic Physics

Scientific paper

10.1088/0022-3727/37/23/003

Spectra from xenon ions have been recorded at the NIST EBIT and the emission into a 2% bandwidth at 13.5 nm arising from 4d-5p transitions compared with that from 4d-4f and 4p-4d transitions in Xe XI and also with that obtained from the unresolved transition array (UTA) observed to peak just below 11 nm. It was found that an improvement of a factor of five could be gained in photon yield using the UTA rather than the 4d-5p emission. The results are compared with atomic structure calculations and imply that a significant gain in efficiency should be obtained using tin, in which the emission at 13.5 nm comes from a similar UTA, rather than xenon as an EUVL source material.

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