Use of real-time Fourier Transform Infrared Reflectivity as an in situ monitor of YBCO film growth and processing

Details Use of real-time Fourier Transform Infrared Reflectivity as an in situ monitor of YBCO film growth and processing Use of real-time Fourier Transform Infrared Reflectivity as an in situ monitor of YBCO film growth and processing

2007-01-18

arxiv.org/abs/cond-mat/0701462v1

Appl. Phys. Lett. 90, 261917 (2007) (3 pages)

Physics

Condensed Matter

Materials Science

13 pages, 3 figures The following article has been submitted to Applied Physics Letters. After it is published, it will be fou

Scientific paper

10.1063/1.2753118

Fourier Transform Infrared (FTIR) spectroscopy has been utilized during high rate E-beam evaporation/deposition of YBa2Cu3O7 (YBCO). The results demonstrate the great utility of FTIR as an in situ monitor of YBCO deposition and processing. We detect different (amorphous/fine polycrystalline) insulating pre-existing phases to the high Tc superconducting phase which appear to have distinct reflectivity fingerprints dominated by thin film interference effects, as a function of temperature and oxygen pressure. These fingerprints reveal some of the kinetic and thermodynamic pathways during the growth of YBCO.

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