Ultrafast Imaging and the "Phase Problem" for Inelastic X-Ray Scattering

Details Ultrafast Imaging and the "Phase Problem" for Inelastic X-Ray Scattering Ultrafast Imaging and the "Phase Problem" for Inelastic X-Ray Scattering

2009-06-06

arxiv.org/abs/0906.1276v3

Physics

Condensed Matter

Other Condensed Matter

General-interest paper; 19 pages, 3 figures; submission to Advanced Materials

Scientific paper

We describe a new method for imaging ultrafast dynamics in condensed matter using inelastic x-ray scattering (IXS). We use the concepts of causality and irreversibility to construct a general solution to the inverse scattering problem (or "phase problem") for inelastic x-ray scattering, which enables direct imaging of dynamics of the electron density with resolutions of ~1 attosecond (10-18 sec) in time and < 1 A in space. This method is not a Fourier transform of IXS data, but a means to impose causality on the data and reconstruct the charge propagator. The method can also be applied to inelastic electron or neutron scattering. We give a general outline of phenomena that can and cannot be studied with this technique, and provide an outlook for the future.

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