Tuning flux-pinning in epitaxial NdBa2Cu3O7-x films via engineered, hybrid nanoscale defect structures

Details Tuning flux-pinning in epitaxial NdBa2Cu3O7-x films via engineered, hybrid nanoscale defect structures Tuning flux-pinning in epitaxial NdBa2Cu3O7-x films via engineered, hybrid nanoscale defect structures

2008-09-23

arxiv.org/abs/0809.3974v1

Physics

Condensed Matter

Superconductivity

13 pages, 3figures, submitted to Applied Physics Express

Scientific paper

10.1143/APEX.1.111702

Epitaxial NdBa2Cu3O7-x films with a hybrid nanoscale defect structure comprised of BaZrO3 nanodot arrays aligned along the c-axis in one half of the film thickness and aligned perpendicular to the c-axis in the other half thickness of the film were fabricated. Transmission electron microscopy images confirm the orientation of the nanoscale defect structures. The angular dependence of critical current density, Jc, at 77 K, 1 T, shows significantly reduced angular variation of Jc. This study nicely demonstrates how pinning characteristics can be tuned by tuning the nanoscale defect structures within the films.

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