Transition Edge Sensor Thermometry for On-chip Materials Characterization

Details Transition Edge Sensor Thermometry for On-chip Materials Characterization Transition Edge Sensor Thermometry for On-chip Materials Characterization

2011-01-31

arxiv.org/abs/1101.5916v1

Physics

Condensed Matter

Mesoscale and Nanoscale Physics

Published in proceedings 21ST INTERNATIONAL SYMPOSIUM ON SPACE TERAHERTZ TECHNOLOGY, OXFORD, 23-25 MARCH, 2010

Scientific paper

The next generation of ultra-low-noise cryogenic detectors for space science applications require continued exploration of materials characteristics at low temperatures. The low noise and good energy sensitivity of current Transition Edge Sensors (TESs) permits measurements of thermal parameters of mesoscopic systems with unprecedented precision. We describe a radiometric technique for differential measurements of materials characteristics at low temperatures (below about 3K). The technique relies on the very broadband thermal radiation that couples between impedance-matched resistors that terminate a Nb superconducting microstrip and the power exchanged is measured using a TES. The capability of the TES to deliver fast, time-resolved thermometry further expands the parameter space: for example to investigate time-dependent heat capacity. Thermal properties of isolated structures can be measured in geometries that eliminate the need for complicating additional components such as the electrical wires of the thermometer itself. Differential measurements allow easy monitoring of temperature drifts in the cryogenic environment. The technique is rapid to use and easily calibrated. Preliminary results will be discussed.

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