Topological defects, pattern evolution, and hysteresis in thin magnetic films

Details Topological defects, pattern evolution, and hysteresis in thin magnetic films Topological defects, pattern evolution, and hysteresis in thin magnetic films

2005-11-25

arxiv.org/abs/cond-mat/0511613v1

Physics

Condensed Matter

Statistical Mechanics

Accepted to EPL; 7 pages, 3 color figures

Scientific paper

10.1209/epl/i2005-10367-8

Nature of the magnetic hysteresis for thin films is studied by the Monte-Carlo simulations. It is shown that a reconstruction of the magnetization pattern with external field occurs via the creation of vortex-antivortex pairs of a special kind at the boundaries of stripe domains. It is demonstrated that the symmetry of order parameter is of primary importance for this problem, in particular, the in-plane magnetic anisotropy is necessary for the hysteresis.

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