Ti-rich and Cu-poor grain-boundary layers of CaCu$_3$Ti$_4$O$_{12}$ detected by x-ray photoelectron spectroscopy

Details Ti-rich and Cu-poor grain-boundary layers of CaCu$_3$Ti$_4$O$_{12}$ detected by x-ray photoelectron spectroscopy Ti-rich and Cu-poor grain-boundary layers of CaCu$_3$Ti$_4$O$_{12}$ detected by x-ray photoelectron spectroscopy

2007-08-17

arxiv.org/abs/0708.2301v1

APPLIED PHYSICS LETTERS 91, 052910 (2007)

Physics

Condensed Matter

Materials Science

8 pages, 3 figures

Scientific paper

10.1063/1.2768006

Cleaved and polished surfaces of CaCu$_3$Ti$_4$O$_{12}$ ceramics have been investigated by x-ray photoelectron spectroscopy (XPS) and energy dispersive x-ray spectroscopy (EDX), respectively. While EDX technique shows the identical CaCu$_3$Ti$_4$O$_{12}$ stoichiometry for the two surfaces, XPS indicates that the cleaved surface with grain-boundary layers is remarkably Ti-rich and Cu-poor. The core-level spectrum of Cu 2$p$ unambiguously shows the existence of monovalent copper only for the cleaved surface. Possible grain-boundary structure and its formation are discussed.

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