Thickness dependence of the exchange bias in epitaxial manganite bilayers

Details Thickness dependence of the exchange bias in epitaxial manganite bilayers Thickness dependence of the exchange bias in epitaxial manganite bilayers

2008-04-17

arxiv.org/abs/0804.2909v2

Physics

Condensed Matter

Strongly Correlated Electrons

7 pages. 8 figures

Scientific paper

10.1103/PhysRevB.79.094405

Exchange bias has been studied in a series of La2/3Ca1/3MnO3 / La1/3Ca2/3MnO3 bilayers grown on (001) SrTiO3 substrates by ozone-assisted molecular beam epitaxy. The high crystalline quality of the samples and interfaces has been verified using high-resolution X-ray diffractometry and Z-contrast scanning transmission electron microscopy with electron energy loss spectroscopy. The dependence of exchange bias on the thickness of the antiferromagnetic layer has been investigated. A critical value for the onset of the hysteresis loop shift has been determined. An antiferromagnetic anisotropy constant has been obtained by fitting the results to the generalized Meiklejohn-Bean model.

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