Thickness dependence of surface diffusion in epitaxial LaAlO3 on SrTiO3(001)

Details Thickness dependence of surface diffusion in epitaxial LaAlO3 on SrTiO3(001) Thickness dependence of surface diffusion in epitaxial LaAlO3 on SrTiO3(001)

2010-10-27

arxiv.org/abs/1010.5548v1

Physics

Condensed Matter

Materials Science

4 pages, 4 figures

Scientific paper

The LaAlO3/SrTiO3 (001) thin film materials system was studied using in situ, simultaneous x-ray diffuse scattering and specular reflectivity during pulsed laser deposition. Using this method, we are able to measure the time dependence of the characteristic surface length scale and the characteristic time for both in-plane and downhill diffusion. These data allow for the determination of the activation energy for various diffusion processes as a function of LaAlO3 thickness. Additionally, we show that the downhill diffusion rate of the first monolayer is distinctly different than subsequent layers. These results are directly compared to previous experimental observations seen during the deposition of homoepitaxial SrTiO3 (001).

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