Physics – Condensed Matter – Mesoscale and Nanoscale Physics
Scientific paper
2010-02-23
Physics
Condensed Matter
Mesoscale and Nanoscale Physics
24 pages, 5 figures
Scientific paper
Thermal fluctuation of the cantilever position sets a fundamental limit for the precision of any Scanning Force Microscope. In the present work we analyse how these fluctuations limit the determination of the resonance frequency of the tip-sample system. The basic principles of frequency detection in Dynamic Scanning Force Microscopy are revised and the precise response of a typical frequency detection unit to thermal fluctuation of the cantilever is analysed in detail. A general relation for thermal frequency noise is found as a function of measurement bandwidth and cantilever oscillation. For large oscillation amplitude and low bandwidth, this relation converges to the result known from the literature, while for low oscillation amplitude and large bandwidth we find that the thermal frequency noise is equal to the width of the resonance curve and therefore stays finite, contrary to what is predicted by the relation known so far. The results presented in this work fundamentally determine the ultimate limits of Dynamic Scanning Force Microscopy.
Abad José
Abellan J.
Colchero Jaime
Cuenca M.
Gonzalez Martinez Juan Francisco
No associations
LandOfFree
Thermal frequency noise in low oscillation amplitude Dynamic Scanning Force Microscopy does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.
If you have personal experience with Thermal frequency noise in low oscillation amplitude Dynamic Scanning Force Microscopy, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Thermal frequency noise in low oscillation amplitude Dynamic Scanning Force Microscopy will most certainly appreciate the feedback.
Profile ID: LFWR-SCP-O-169870